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Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy

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dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorTait, Jeffrey
dc.contributor.authorEyben, Pierre
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorSurana, Supriya
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.date.accessioned2021-10-23T10:18:24Z
dc.date.available2021-10-23T10:18:24Z
dc.date.issued2016
dc.identifier.issn2040-3364
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26448
dc.identifier.urlhttp://pubs.rsc.org/en/content/articlelanding/2016/nr/c5nr08765a#!divAbstract
dc.source.beginpage3629
dc.source.endpage3637
dc.source.issue6
dc.source.journalNanoscale
dc.source.volume8
dc.title

Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy

dc.typeJournal article
dspace.entity.typePublication
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