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Experimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETs
Publication:
Experimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETs
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Date
2004
Proceedings Paper
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9021.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
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1846
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations
Metrics
Views
1846
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations