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PIXE as a complementary technique to RBS in thin film characterization
Publication:
PIXE as a complementary technique to RBS in thin film characterization
Date
2012-03
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meersschaut, Johan
;
Kayhko, Marko
;
Lenka, Hara
;
Zhao, Qiang
;
Vantomme, Andre
;
Vandervorst, Wilfried
Journal
Abstract
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1873
since deposited on 2021-10-20
408
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1873
since deposited on 2021-10-20
408
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations