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Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes

Date

1995
Proceedings Paper
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dc.contributor.authorRoca, Elisenda
dc.contributor.authorLarsen, Kim Kyllesbech
dc.contributor.authorKolodinski, Sabine
dc.contributor.authorMertens, Robert
dc.contributor.imecauthorMertens, Robert
dc.date.accessioned2021-09-29T13:15:55Z
dc.date.available2021-09-29T13:15:55Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/838
dc.source.beginpage465
dc.source.conferenceInfrared Technology XXI; 9-13 July 1995; San Diego, CA, USA.
dc.source.conferencelocation
dc.source.endpage61
dc.title

Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes

dc.typeProceedings paper
dspace.entity.typePublication
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