Publication:
MTJ degradation in multi-pillar SOT-MRAM with selective writing
| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | Cai, Kaiming | |
| dc.contributor.author | Fan, Kaiquan | |
| dc.contributor.author | Talmelli, Giacomo | |
| dc.contributor.author | Trovato, Anna | |
| dc.contributor.author | Jossart, Nico | |
| dc.contributor.author | Rao, Siddharth | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Couet, Sebastien | |
| dc.contributor.imecauthor | Van Beek, Simon | |
| dc.contributor.imecauthor | Cai, Kaiming | |
| dc.contributor.imecauthor | Fan, Kaiquan | |
| dc.contributor.imecauthor | Talmelli, Giacomo | |
| dc.contributor.imecauthor | Trovato, Anna | |
| dc.contributor.imecauthor | Jossart, Nico | |
| dc.contributor.imecauthor | Rao, Siddharth | |
| dc.contributor.imecauthor | Couet, Sebastien | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
| dc.contributor.orcidimec | Cai, Kaiming::0000-0002-1160-864X | |
| dc.contributor.orcidimec | Fan, Kaiquan::0000-0003-4875-7179 | |
| dc.contributor.orcidimec | Talmelli, Giacomo::0000-0001-7763-7008 | |
| dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
| dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
| dc.contributor.orcidimec | Jossart, Nico::0009-0003-2798-8290 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.date.accessioned | 2024-03-21T10:47:49Z | |
| dc.date.available | 2023-07-15T17:05:31Z | |
| dc.date.available | 2024-03-21T10:47:49Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | This work is supported by imec's industrial Affiliation program on MRAM devices. The authors would also like to acknowledge the support of imec's fab, line and hardware teams. This project has received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie grant agreement No 955671. | |
| dc.identifier.doi | 10.1109/IRPS48203.2023.10117917 | |
| dc.identifier.eisbn | 978-1-6654-5672-2 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42153 | |
| dc.publisher | IEEE | |
| dc.source.conference | 61st IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 26-30, 2023 | |
| dc.source.conferencelocation | Monterey | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 7 | |
| dc.title | MTJ degradation in multi-pillar SOT-MRAM with selective writing | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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