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Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's
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1946 since deposited on 2021-09-30
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Acq. date: 2025-10-25
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1946 since deposited on 2021-09-30
432item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations