Confocal microscopy and spectroscopy of InGaN epilayers on sapphire

dc.contributor.author	O'Donnell, K. P.
dc.contributor.author	Tobin, M. J.
dc.contributor.author	Bayliss, S. C.
dc.contributor.author	Van der Stricht, Wim
dc.date.accessioned	2021-10-14T11:32:17Z
dc.date.available	2021-10-14T11:32:17Z
dc.date.embargo	9999-12-31
dc.date.issued	1999
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/3715
dc.source.beginpage	105
dc.source.endpage	108
dc.source.issue	2
dc.source.journal	Journal of Microscopy
dc.source.volume	193
dc.title	Confocal microscopy and spectroscopy of InGaN epilayers on sapphire
dc.type	Journal article
dspace.entity.type	Publication
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