Publication:
Self-focusing SIMS
Date
| dc.contributor.author | Franquet, Alexis | |
| dc.contributor.imecauthor | Franquet, Alexis | |
| dc.contributor.orcidimec | Franquet, Alexis::0000-0002-7371-8852 | |
| dc.date.accessioned | 2021-10-27T09:20:01Z | |
| dc.date.available | 2021-10-27T09:20:01Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32982 | |
| dc.identifier.url | https://www.essentialknowledgebriefings.com/dynamic-secondary-ion-mass-spectrometry/ | |
| dc.source.beginpage | 29 | |
| dc.source.book | Dynamic Secondary Ion Mass Spectrometry | |
| dc.source.endpage | 31 | |
| dc.title | Self-focusing SIMS | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |