Characterisation of epitaxial laterally overgrown Gallium Nitride using transmission electron microscopy

dc.contributor.author	Tricker, D. M.
dc.contributor.author	Jacobs, Koen
dc.contributor.author	Humphreys, C. J.
dc.date.accessioned	2021-10-14T11:44:20Z
dc.date.available	2021-10-14T11:44:20Z
dc.date.embargo	9999-12-31
dc.date.issued	1999
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/3893
dc.source.beginpage	633
dc.source.endpage	637
dc.source.issue	1
dc.source.journal	Physica Status Solidi B
dc.source.volume	216
dc.title	Characterisation of epitaxial laterally overgrown Gallium Nitride using transmission electron microscopy
dc.type	Journal article
dspace.entity.type	Publication
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