Publication:

An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage

Date

2024
Journal article
https://doi.org/10.3390/mi15060769
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dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecDegraeve, Robin::0000-0002-4609-5573
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.date.accessioned2024-09-11T10:24:22Z
dc.date.available2024-07-04T18:38:13Z
dc.date.available2024-09-11T10:24:22Z
dc.date.embargo2024-06-08
dc.date.issued2024
dc.description.wosFundingTextThis work was supported in part by CyberSecurity Research Flanders, reference number VR20192203.
dc.identifier.doi10.3390/mi15060769
dc.identifier.issn2072-666X
dc.identifier.pmidMEDLINE:38930739
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44119
dc.publisherMDPI
dc.source.beginpageArt. 769
dc.source.endpageN/A
dc.source.issue6
dc.source.journalMICROMACHINES
dc.source.numberofpages23
dc.source.volume15
dc.subject.keywordsRECOVERY
dc.subject.keywordsBTI
dc.subject.keywordsHCI
dc.subject.keywordsVARIABILITY
dc.subject.keywordsGENERATION
dc.subject.keywordsIMPACT
dc.subject.keywordsMOSFET
dc.subject.keywordsNBTI
dc.title

An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage

dc.typeJournal article
dspace.entity.typePublication
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