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CD control for 180-nm and 130-nm gate-level lithography
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CD control for 180-nm and 130-nm gate-level lithography
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Date
1996
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Kee - Ho
;
Ronse, Kurt
;
Goethals, Mieke
;
Vandenberghe, Geert
;
Van den hove, Luc
Journal
Microlithography World
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Acq. date: 2025-12-10
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Views
2025
since deposited on 2021-09-29
2
last month
1
last week
Acq. date: 2025-12-10
Citations