Publication:
Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
Date
| dc.contributor.author | Bernardini, S. | |
| dc.contributor.author | Masson, P. | |
| dc.contributor.author | Houssa, Michel | |
| dc.contributor.author | Lalande, F. | |
| dc.contributor.imecauthor | Houssa, Michel | |
| dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
| dc.date.accessioned | 2021-10-15T12:42:44Z | |
| dc.date.available | 2021-10-15T12:42:44Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8568 | |
| dc.source.beginpage | 4251 | |
| dc.source.endpage | 4253 | |
| dc.source.issue | 21 | |
| dc.source.journal | Applied Physics Letters | |
| dc.source.volume | 84 | |
| dc.title | Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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