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Investigation of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation
Publication:
Investigation of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation
Date
2014
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Andrade, Maria Gloria Cano
;
Martino, Joao
;
Aoulaiche, Marc
;
Collaert, Nadine
;
Simoen, Eddy
;
Claeys, Cor
Journal
Microelectronics Reliability
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1816
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1816
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations