Publication:
Generation and annealing behaviour of MeV proton and 252Cf irradiation induced deep levels in silicon diodes
Date
| dc.contributor.author | Vanhellemont, Jan | |
| dc.contributor.author | Kaniava, Arvydas | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Trauwaert, Marie-Astrid | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Johlander, B. | |
| dc.contributor.author | Harboe-Sörensen, R. | |
| dc.contributor.author | Adams, L. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-09-29T12:51:14Z | |
| dc.date.available | 2021-09-29T12:51:14Z | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/424 | |
| dc.source.beginpage | 479 | |
| dc.source.endpage | 486 | |
| dc.source.issue | 3 | |
| dc.source.journal | IEEE Transactions on Nuclear Science | |
| dc.source.volume | 41 | |
| dc.title | Generation and annealing behaviour of MeV proton and 252Cf irradiation induced deep levels in silicon diodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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