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Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation

Date

1996
Proceedings Paper
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dc.contributor.authorPoortmans, Jef
dc.contributor.authorVermeulen, Tom
dc.contributor.authorNijs, Johan
dc.contributor.authorMertens, Robert
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-09-29T15:17:46Z
dc.date.available2021-09-29T15:17:46Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1420
dc.source.beginpage721
dc.source.conferenceConference Record of the 25th IEEE Photovoltaic Specialists Conference
dc.source.conferencedate13/05/1997
dc.source.conferencelocationWashington, DC USA
dc.source.endpage724
dc.title

Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation

dc.typeProceedings paper
dspace.entity.typePublication
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