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The "permanent" component of NBTI revisited: saturation, degradation-reversal, and annealing

Date

2016
Proceedings Paper
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dc.contributor.authorGrasser, T.
dc.contributor.authorWaltl, M.
dc.contributor.authorRzepa, G.
dc.contributor.authorGoes, W.
dc.contributor.authorWimmer, Y.
dc.contributor.authorEl-Sayed, A.-M.
dc.contributor.authorShluger, A. L.
dc.contributor.authorReisinger, H.
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-23T11:01:04Z
dc.date.available2021-10-23T11:01:04Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26665
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7574504/
dc.source.beginpage5A-2-1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate17/04/2016
dc.source.conferencelocationPasadena, CA USA
dc.source.endpage5A-2-8
dc.title

The "permanent" component of NBTI revisited: saturation, degradation-reversal, and annealing

dc.typeProceedings paper
dspace.entity.typePublication
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