Publication:
Benchmarking on-chip optical against electrical interconnect for high-performance applications
Date
| dc.contributor.author | Stucchi, Michele | |
| dc.contributor.author | Cosemans, Stefan | |
| dc.contributor.author | Van Campenhout, Joris | |
| dc.contributor.author | Tokei, Zsolt | |
| dc.contributor.author | Beyer, Gerald | |
| dc.contributor.imecauthor | Stucchi, Michele | |
| dc.contributor.imecauthor | Cosemans, Stefan | |
| dc.contributor.imecauthor | Van Campenhout, Joris | |
| dc.contributor.imecauthor | Tokei, Zsolt | |
| dc.contributor.imecauthor | Beyer, Gerald | |
| dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
| dc.date.accessioned | 2021-10-19T19:19:54Z | |
| dc.date.available | 2021-10-19T19:19:54Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19845 | |
| dc.source.beginpage | 3.2 | |
| dc.source.conference | IEEE International Interconnect Technology Conference and Materials for Advanced Metallization - IITC/MAM | |
| dc.source.conferencedate | 9/05/2011 | |
| dc.source.conferencelocation | Dresden Germany | |
| dc.title | Benchmarking on-chip optical against electrical interconnect for high-performance applications | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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