Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Temperature-dependent modeling and characterization of Through Silicon Via (TSV) capacitance
Publication:
Temperature-dependent modeling and characterization of Through Silicon Via (TSV) capacitance
Copy permalink
Date
2011
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
22596.pdf
333.71 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Katti, Guruprasad
;
Stucchi, Michele
;
Velenis, Dimitrios
;
Soree, Bart
;
De Meyer, Kristin
;
Dehaene, Wim
Journal
IEEE Electron Device Letters
Abstract
Description
Metrics
Views
1946
since deposited on 2021-10-19
3
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1946
since deposited on 2021-10-19
3
last month
Acq. date: 2025-12-15
Citations