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Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers
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Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Frigeri, C.
;
Serenyi, M.
;
Nguyen, Q.K.
;
Csik, A.
;
Riesz, F.
;
Erdelyi, Z.
;
Nasi, L.
;
Beke, D.L.
;
Boyen, Hans-Gerd
Journal
Nanoscale Research Letters
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1840
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Acq. date: 2025-12-12
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Metrics
Views
1840
since deposited on 2021-10-19
3
last month
Acq. date: 2025-12-12
Citations