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E- and vE-model too conservative to describe low field time dependent dielectric breakdown

Date

2010
Proceedings Paper
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dc.contributor.authorCroes, Kristof
dc.contributor.authorTokei, Zsolt
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.accessioned2021-10-18T15:43:40Z
dc.date.available2021-10-18T15:43:40Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16919
dc.source.beginpage543
dc.source.conference48th Annual IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/05/2010
dc.source.conferencelocationAnaheim, CA USA
dc.source.endpage548
dc.title

E- and vE-model too conservative to describe low field time dependent dielectric breakdown

dc.typeProceedings paper
dspace.entity.typePublication
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