Publication:

Charge pumping and mobility measurements on strained SOI MOSFETs

Date

2007
Proceedings Paper
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dc.contributor.authorSchmidt, M.
dc.contributor.authorGottlob, H. D. B.
dc.contributor.authorEchermeyer, T.
dc.contributor.authorWahlbrink, T.
dc.contributor.authorMollenhauer, T.
dc.contributor.authorBaus, M.
dc.contributor.authorBuca, D.M.
dc.contributor.authorMantl, S.
dc.contributor.authorReiche, M.
dc.contributor.authorLoo, Roger
dc.contributor.authorLemme, M.C.
dc.contributor.authorKurz, H.
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-16T19:28:23Z
dc.date.available2021-10-16T19:28:23Z
dc.date.embargo9999-12-31
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12855
dc.source.conference8th European Workshop on ULtimate Integration of Silicon - ULIS
dc.source.conferencedate14/03/2007
dc.source.conferencelocationLeuven Belgium
dc.title

Charge pumping and mobility measurements on strained SOI MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
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