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Assessing Bias-Temperature Instabilities and Self-Heating Effects in Advanced Semiconductor Nodes
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Assessing Bias-Temperature Instabilities and Self-Heating Effects in Advanced Semiconductor Nodes
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Date
2016-10
Dissertation
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43264.pdf
19.8 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bury, Erik
Journal
Abstract
Description
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1957
since deposited on 2021-10-23
Acq. date: 2025-12-15
Citations
Metrics
Views
1957
since deposited on 2021-10-23
Acq. date: 2025-12-15
Citations