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Conference contributions
Soft breakdown of ultra-thin gate oxide layers
Publication:
Soft breakdown of ultra-thin gate oxide layers
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Date
1995
Proceedings Paper
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593.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Heyns, Marc
;
Mertens, Paul
Journal
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1871
since deposited on 2021-09-29
Acq. date: 2026-02-24
Citations
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Views
1871
since deposited on 2021-09-29
Acq. date: 2026-02-24
Citations