Publication:
Understanding the Origin of Recombination Losses After Co-Plating of Bifacial Solar Cells: In-Depth Microstructure Study
| dc.contributor.author | Depauw, Valerie | |
| dc.contributor.author | Russell, Richard | |
| dc.contributor.author | Singh, Sukhvinder | |
| dc.contributor.author | Recaman Payo, Maria | |
| dc.contributor.author | Aleman, Monica | |
| dc.contributor.author | Jambaldinni, Shruti | |
| dc.contributor.author | Duerinckx, Filip | |
| dc.contributor.author | Gordon, Ivan | |
| dc.contributor.author | Szlufcik, Jozef | |
| dc.contributor.author | Abdulraheem, Yaser | |
| dc.contributor.author | Poortmans, Jef | |
| dc.contributor.imecauthor | Depauw, Valerie | |
| dc.contributor.imecauthor | Singh, Sukhvinder | |
| dc.contributor.imecauthor | Recaman Payo, Maria | |
| dc.contributor.imecauthor | Aleman, Monica | |
| dc.contributor.imecauthor | Jambaldinni, Shruti | |
| dc.contributor.imecauthor | Duerinckx, Filip | |
| dc.contributor.imecauthor | Gordon, Ivan | |
| dc.contributor.imecauthor | Szlufcik, Jozef | |
| dc.contributor.imecauthor | Poortmans, Jef | |
| dc.contributor.orcidext | Aleman, Monica::0000-0002-7388-4789 | |
| dc.contributor.orcidimec | Depauw, Valerie::0000-0003-2045-9698 | |
| dc.contributor.orcidimec | Singh, Sukhvinder::0000-0003-1985-0534 | |
| dc.contributor.orcidimec | Duerinckx, Filip::0000-0003-2570-7371 | |
| dc.contributor.orcidimec | Gordon, Ivan::0000-0002-0713-8403 | |
| dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
| dc.date.accessioned | 2022-02-18T13:00:17Z | |
| dc.date.available | 2022-02-18T13:00:17Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/JPHOTOV.2021.3062969 | |
| dc.identifier.issn | 2156-3381 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38884 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 858 | |
| dc.source.endpage | 865 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE JOURNAL OF PHOTOVOLTAICS | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 11 | |
| dc.subject.keywords | SILICON | |
| dc.subject.keywords | NICKEL | |
| dc.subject.keywords | DEPOSITION | |
| dc.subject.keywords | FRONT | |
| dc.subject.keywords | HF | |
| dc.title | Understanding the Origin of Recombination Losses After Co-Plating of Bifacial Solar Cells: In-Depth Microstructure Study | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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