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Uniaxial stress efficiency for different fin dimensions of triple-gate SOI MOSFETs
Publication:
Uniaxial stress efficiency for different fin dimensions of triple-gate SOI MOSFETs
Date
2011
Proceedings Paper
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23071.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Buhler, R.T.
;
Agopian, P.D.G.
;
Giacomini, R.
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, J.A.
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1916
since deposited on 2021-10-19
Acq. date: 2025-10-30
Citations
Metrics
Views
1916
since deposited on 2021-10-19
Acq. date: 2025-10-30
Citations