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Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories
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Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories
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Date
2010-06
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deleruyelle, Damien
;
Muller, Christophe
;
Amouroux, Julien
;
Muller, Robert
Journal
Applied Physics Letters
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1908
since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations
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Views
1908
since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations