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Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories
Publication:
Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories
Date
2010-06
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deleruyelle, Damien
;
Muller, Christophe
;
Amouroux, Julien
;
Muller, Robert
Journal
Applied Physics Letters
Abstract
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1907
since deposited on 2021-10-18
Acq. date: 2025-10-26
Citations
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Views
1907
since deposited on 2021-10-18
Acq. date: 2025-10-26
Citations