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Tof-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides
Publication:
Tof-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides
Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssiau, L.
;
Vitchev, R.G.
;
Conard, Thierry
;
Vandervorst, Wilfried
;
Bender, Hugo
Journal
Abstract
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1950
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Acq. date: 2025-10-24
Citations
Metrics
Views
1950
since deposited on 2021-10-15
420
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations