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Effect of oxide and W-CMP on the material properties and electromigration behaviour of layered aluminium metallizations
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Effect of oxide and W-CMP on the material properties and electromigration behaviour of layered aluminium metallizations
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Heyvaert, Ilse
;
Van Hove, Marleen
;
Witvrouw, Ann
;
Maex, Karen
;
Saerens, Annelies
;
Roussel, Philippe
;
Bender, Hugo
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2034
since deposited on 2021-10-06
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Acq. date: 2025-12-11
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Metrics
Views
2034
since deposited on 2021-10-06
1
last month
1
last week
Acq. date: 2025-12-11
Citations