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Voids in kesterites and the influence of lamellae preparation by focused ion beam for transmission electron microsccopy analyses

Date

2019
Journal article
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dc.contributor.authorRibeiro-Andrade, Rodrigo
dc.contributor.authorSahayaraj, Sylvester
dc.contributor.authorVermang, Bart
dc.contributor.authorRosario Correia, M.
dc.contributor.authorSadewasser, Sascha
dc.contributor.authorGonzalez, Juan Carlos
dc.contributor.authorFernandes, Paulo A.
dc.contributor.authorSalomé, Pedro M.P.
dc.contributor.imecauthorVermang, Bart
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.date.accessioned2021-10-27T17:05:34Z
dc.date.available2021-10-27T17:05:34Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.issn2156-3381
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33892
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8610192
dc.source.beginpage565
dc.source.endpage570
dc.source.issue2
dc.source.journalIEEE Journal of Photovoltaics
dc.source.volume9
dc.title

Voids in kesterites and the influence of lamellae preparation by focused ion beam for transmission electron microsccopy analyses

dc.typeJournal article
dspace.entity.typePublication
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