Publication:

Micro-characterisation of Pt silicides prepared on (100) silicon

Date

1997
Proceedings Paper
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dc.contributor.authorJin, S.
dc.contributor.authorBender, Hugo
dc.contributor.authorAlves Donaton, Ricardo
dc.contributor.authorMaex, Karen
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorMaex, Karen
dc.date.accessioned2021-09-30T08:30:28Z
dc.date.available2021-09-30T08:30:28Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1953
dc.source.beginpage497
dc.source.conferenceMicroscopy of Semiconducting Materials 1997
dc.source.conferencedate7/04/1997
dc.source.conferencelocationOxford UK
dc.source.endpage500
dc.title

Micro-characterisation of Pt silicides prepared on (100) silicon

dc.typeProceedings paper
dspace.entity.typePublication
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