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In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines

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dc.contributor.authorTeodorescu, V.
dc.contributor.authorNistor, Leona
dc.contributor.authorBender, Hugo
dc.contributor.authorSteegen, An
dc.contributor.authorLauwers, A.
dc.contributor.authorMaex, Karen
dc.contributor.authorVan Landuyt, J.
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorMaex, Karen
dc.date.accessioned2021-10-14T17:58:09Z
dc.date.available2021-10-14T17:58:09Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5702
dc.source.beginpage167
dc.source.endpage174
dc.source.issue1
dc.source.journalJournal of Applied Physics
dc.source.volume90
dc.title

In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines

dc.typeJournal article
dspace.entity.typePublication
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