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Present reliability issues in ultrathin oxinitride films
Publication:
Present reliability issues in ultrathin oxinitride films
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Date
2005-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
Arkhipov, Vladimir
;
Groeseneken, Guido
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1832
since deposited on 2021-10-16
Acq. date: 2025-12-17
Citations
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Views
1832
since deposited on 2021-10-16
Acq. date: 2025-12-17
Citations