Publication:
Defect generation under electrical stress: experimental characterization and modelling
Date
| dc.contributor.author | Houssa, Michel | |
| dc.contributor.imecauthor | Houssa, Michel | |
| dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
| dc.date.accessioned | 2021-10-15T04:56:54Z | |
| dc.date.available | 2021-10-15T04:56:54Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7664 | |
| dc.source.beginpage | 467 | |
| dc.source.book | High-K Gate Dielectrics | |
| dc.source.endpage | 495 | |
| dc.title | Defect generation under electrical stress: experimental characterization and modelling | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | ||
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