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On radiation damage in SiGe devices and its recovery behavior
Publication:
On radiation damage in SiGe devices and its recovery behavior
Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohyama, H.
;
Takami, Y.
;
Vanhellemont, J.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
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1965
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1965
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations