Publication:
Ferroelectricity in binary oxides as studied by electrical scanning probe techniques
Date
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.date.accessioned | 2021-10-27T07:53:36Z | |
| dc.date.available | 2021-10-27T07:53:36Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32663 | |
| dc.source.conference | 61st Electronic Materials Conference, EMC 2019 | |
| dc.source.conferencedate | 26/06/2019 | |
| dc.source.conferencelocation | Ann Harbor, MI USA | |
| dc.title | Ferroelectricity in binary oxides as studied by electrical scanning probe techniques | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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