Publication:

Demonstration of fully Ni-silicided metal gates on HfO2 based high-k gate dielectrics as a candidate for low power applications

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1887 since deposited on 2021-10-15
Acq. date: 2025-10-22

Citations

Metrics

Views

1887 since deposited on 2021-10-15
Acq. date: 2025-10-22

Citations