Publication:

Understanding Anti-ferroelectric Behavior and Wake-up in La Doped HZO Metal-Ferroelectric-Metal Capacitors Using Nucleation Limited Switching Model

 
dc.contributor.authorWalke, Amey
dc.contributor.authorClima, Sergiu
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecWalke, Amey::0000-0001-8406-8122
dc.contributor.orcidimecPopovici, Mihaela Ioana::0000-0002-9838-1088
dc.date.accessioned2025-04-10T15:19:28Z
dc.date.available2025-02-02T17:53:57Z
dc.date.available2025-04-10T15:19:28Z
dc.date.issued2024
dc.identifier.doi10.1109/ESSERC62670.2024.10719525
dc.identifier.eisbn979-8-3503-8813-8
dc.identifier.isbn979-8-3503-8814-5
dc.identifier.issn1930-8833
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45138
dc.publisherIEEE
dc.source.beginpage565
dc.source.conference50th IEEE European Solid-State Electronics Research Conference (ESSERC)
dc.source.conferencedateSEP 09-12, 2024
dc.source.conferencelocationBruges
dc.source.endpage568
dc.source.journalN/A
dc.source.numberofpages4
dc.title

Understanding Anti-ferroelectric Behavior and Wake-up in La Doped HZO Metal-Ferroelectric-Metal Capacitors Using Nucleation Limited Switching Model

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: