Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Exchange bias induced by O ion implantation in ferromagnetic thin films
Publication:
Exchange bias induced by O ion implantation in ferromagnetic thin films
Date
2012
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
25495.pdf
623.17 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Demeter, J.
;
Menendez, E.
;
Schrauwen, A.
;
Teichert, A.
;
Steitz, R.
;
Vandezande, S.
;
Wildes, A. R.
;
Vandervorst, Wilfried
;
Temst, K.
;
Vantomme, Andre
Journal
Journal of Physics D: Applied Physics
Abstract
Description
Metrics
Views
1940
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1940
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations