Publication:

Intra-network interference robustness: An empirical evaluation of IEEE 802.15.4-2015 SUN-OFDM

Date

2020
Journal article
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dc.contributor.authorElsas, Robbe
dc.contributor.authorHoebeke, Jeroen
dc.contributor.authorVan Leemput, Dries
dc.contributor.authorShahid, Adnan
dc.contributor.authorDaneels, Glenn
dc.contributor.authorFamaey, Jeroen
dc.contributor.authorDe Poorter, Eli
dc.contributor.imecauthorElsas, Robbe
dc.contributor.imecauthorHoebeke, Jeroen
dc.contributor.imecauthorVan Leemput, Dries
dc.contributor.imecauthorShahid, Adnan
dc.contributor.imecauthorDaneels, Glenn
dc.contributor.imecauthorFamaey, Jeroen
dc.contributor.imecauthorDe Poorter, Eli
dc.contributor.orcidimecElsas, Robbe::0000-0002-4427-6987
dc.contributor.orcidimecHoebeke, Jeroen::0000-0003-2039-007X
dc.contributor.orcidimecVan Leemput, Dries::0000-0002-1910-8965
dc.contributor.orcidimecShahid, Adnan::0000-0003-1943-6261
dc.contributor.orcidimecDe Poorter, Eli::0000-0002-0214-5751
dc.date.accessioned2021-10-28T21:32:37Z
dc.date.available2021-10-28T21:32:37Z
dc.date.embargo9999-12-31
dc.date.issued2020
dc.identifier.issn2079-9292
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35095
dc.identifier.urlhttps://doi.org/10.3390/electronics9101691
dc.source.beginpage1691
dc.source.issue10
dc.source.journalElectronics
dc.source.volume9
dc.title

Intra-network interference robustness: An empirical evaluation of IEEE 802.15.4-2015 SUN-OFDM

dc.typeJournal article
dspace.entity.typePublication
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