Publication:
Substrate bias effect on the random telegraph signal parameters in submicrometer silicon p-metal-oxide-semiconductor transistors
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-09-29T13:16:41Z | |
| dc.date.available | 2021-09-29T13:16:41Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/877 | |
| dc.source.beginpage | 910 | |
| dc.source.endpage | 14 | |
| dc.source.issue | 2 | |
| dc.source.journal | J. Appl. Phys. | |
| dc.source.volume | 77 | |
| dc.title | Substrate bias effect on the random telegraph signal parameters in submicrometer silicon p-metal-oxide-semiconductor transistors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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