Publication:
Influence of the electron mean free path on the resistivity of thin metal films
Date
| dc.contributor.author | Zhang, Wenqi | |
| dc.contributor.author | Brongersma, Sywert | |
| dc.contributor.author | Richard, Olivier | |
| dc.contributor.author | Brijs, Bert | |
| dc.contributor.author | Palmans, Roger | |
| dc.contributor.author | Froyen, Ludo | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.imecauthor | Brongersma, Sywert | |
| dc.contributor.imecauthor | Richard, Olivier | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.contributor.orcidimec | Brongersma, Sywert::0000-0002-1755-3897 | |
| dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
| dc.date.accessioned | 2021-10-15T18:15:24Z | |
| dc.date.available | 2021-10-15T18:15:24Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9977 | |
| dc.source.beginpage | 146 | |
| dc.source.endpage | 152 | |
| dc.source.issue | 1_4 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 76 | |
| dc.title | Influence of the electron mean free path on the resistivity of thin metal films | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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