Publication:

Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529453
Simple item page Full metadata Statistics
 
dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorRomano-Molar, Alex
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecDegraeve, Robin::0000-0002-4609-5573
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.date.accessioned2025-05-13T12:50:09Z
dc.date.available2024-08-16T18:28:44Z
dc.date.available2025-05-13T12:50:09Z
dc.date.issued2024
dc.description.wosFundingTextThis work was supported in part by the CyberSecurity Research Flanders with reference number VR20192203.
dc.identifier.doi10.1109/IRPS48228.2024.10529453
dc.identifier.eisbn979-8-3503-6976-2
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44328
dc.publisherIEEE
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 14-18, 2024
dc.source.conferencelocationGrapevine
dc.source.journalN/A
dc.source.numberofpages7
dc.title

Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions