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Electron trap energy distribution in ALD Al2O3, LaAl4Ox, and GdyAl2-yO3 layers on silicon
Publication:
Electron trap energy distribution in ALD Al2O3, LaAl4Ox, and GdyAl2-yO3 layers on silicon
Date
2012
Proceedings Paper
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24887.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wang, Mugwort
;
Badylevich, M.
;
Adelmann, Christoph
;
Swerts, Johan
;
Kittl, Jorge
;
Afanasiev, Valeri
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1855
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1855
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations