Publication:
Comparison between drain induced barrier lowering in partially and fully depleted 0.13 μm SOI nMOSFETs in low temperature operation
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1916 since deposited on 2021-10-15
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Acq. date: 2025-10-24
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Views
1916 since deposited on 2021-10-15
414item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations