Publication:
Comparison between drain induced barrier lowering in partially and fully depleted 0.13 μm SOI nMOSFETs in low temperature operation
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1919 since deposited on 2021-10-15
Acq. date: 2026-01-25
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1919 since deposited on 2021-10-15
Acq. date: 2026-01-25
Citations