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Electrical activity of dislocations and defects in strained Si and Ge based devices
Publication:
Electrical activity of dislocations and defects in strained Si and Ge based devices
Date
2008
Proceedings Paper
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16608.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Verheyen, Peter
;
Loo, Roger
;
Bargallo Gonzalez, Mireia
;
Claeys, Cor
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1861
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Metrics
Views
1861
since deposited on 2021-10-17
409
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations