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High precision micro-scale Hall effect characterization method using in-line micro four-point probes
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High precision micro-scale Hall effect characterization method using in-line micro four-point probes
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Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petersen, Dirch
;
Hansen, Ole
;
Lin, Rong
;
Nielsen, P.F.
;
Clarysse, Trudo
;
Goossens, Jozefien
;
Rosseel, Erik
;
Vandervorst, Wilfried
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1893
since deposited on 2021-10-17
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Acq. date: 2025-12-09
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Metrics
Views
1893
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-09
Citations