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Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers
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Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Krishnasamy, Rajendran
;
Schoenmaker, Wim
;
Decoutere, Stefaan
;
Loo, Roger
;
Caymax, Matty
;
Vandervorst, Wilfried
Journal
IEEE Trans. Electron Devices
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1929
since deposited on 2021-10-14
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Acq. date: 2025-12-15
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Metrics
Views
1929
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2025-12-15
Citations