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Articles
Characterization of electrically active dopant profiles with the spreading resistance probe
Publication:
Characterization of electrically active dopant profiles with the spreading resistance probe
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Clarysse, Trudo
;
Vanhaeren, Danielle
;
Hoflijk, Ilse
;
Vandervorst, Wilfried
Journal
Materials Science and Engineering R: Reports
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1914
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Acq. date: 2025-12-16
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Views
1914
since deposited on 2021-10-15
1
last month
1
last week
Acq. date: 2025-12-16
Citations