Publication:

Substrate optimization for high reliability GaN devices

Date

2018
Presentation
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dc.contributor.authorStoffels, Steve
dc.contributor.authorGeens, Karen
dc.contributor.authorLi, Xiangdong
dc.contributor.authorZhao, Ming
dc.contributor.authorZanoni, Enrico
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorPosthuma, Niels
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorLi, Xiangdong
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorPosthuma, Niels
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecPosthuma, Niels::0000-0002-6029-1909
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-26T04:45:35Z
dc.date.available2021-10-26T04:45:35Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31862
dc.source.conferenceMRS Spring Symposium EP04: Reliability and Materials Issues of Semiconductor Optical and Electron Devices and Materials
dc.source.conferencedate2/04/2018
dc.source.conferencelocationPhoenix, AZ USA
dc.title

Substrate optimization for high reliability GaN devices

dc.typeOral presentation
dspace.entity.typePublication
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