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Low-temperature 193nm resist reflow process for 100 nm generation contact patterning
Publication:
Low-temperature 193nm resist reflow process for 100 nm generation contact patterning
Date
2001
Proceedings Paper
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5759.pdf
1.31 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Driessche, Veerle
;
Lucas, Kevin
;
Van Roey, Frieda
;
Grozev, Grozdan
;
Tzviatkov, Plamen
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Abstract
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2049
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
2049
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations